Characterisation of Single Devices in Glasgow University and the UK

Assembly Details

Some notes on assembly, including wirebond program and design of Al plate, are given here for the single chip card

AssemblyDetails

Characterisation Notes

Christian Gallrapp Guide to USBPix

2012-02-17_ChristianGallrapp_Introduction_to_USBPix.pdf

Kate's Noise Occupancy Scan and Source Scan Instructions

Noise_Occupancy_Scan_Instructions.docx

Source_Scans_Instructions.docx

Basic Files Required For Characterising an Assembly

CONFIGURATION FILES

Basic configuration file for starting tuning of an assembly:

000_BASELINE_CONFIG_all_assemblies.cfg.root

Basic configuration file for VCal measurement of an assembly:

(the primary address of your own Keithley must be correct for this to work)

000_BASELINE_VCAL_CONFIG_all_assemblies.cfg.root

PRIMLISTS

Primlists are lists of scans which can be saved and executed automatically without further manual input.

Primlist containing all initial tests required when testing an assembly:

• RX Delay
• Analog
• Digital
• Noise Occupancy
• Threshold Scan
• ToT Verify

000_BASELINE_TESTS_all_assemblies.prl.root

Primlist for tuning assembly to Threshold of 3200e at ToT o f 8:

3200e_ToT8_overalltuning.prl.root

ROIC only

WaferV6ABC1HChip50

Planar from VTT

15 single assemblies have been produced at VTT. These are detailed at Assemblies.

Summaries and root data files for the assemblies tested are given under the assembly heading.

Assembly test data

Assembly5

Assembly10

Assembly14

Assembly15

Planar

Micron Liverpool

MICRONCurves_2012.xlsx

MPI Sensor

MPI_IV.xlsx

3D

FBK 7

IV Characteristics of the FBK 7 assembly:

IV_Curve_FBK_200212.xlsx

Details of noise characterisation of the FBK 7 assembly:

FBK_Noise.pptx

Further information on FBK 7:

GE_FBK4_3D_07

-- RichardBates - 2012-02-22