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ATLAS/PUUKA Web>Tasks>Modules>SingleDeviceCharacterization>Assembly5 (2012-12-18, KateDoonan)
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ATLAS/PUUKA Web>Tasks>Modules>SingleDeviceCharacterization>Assembly5 (2012-12-18, KateDoonan) EditAttachAssembly 5
Device IV after flip-chip and mouting on the SCC.- Assembly5_02082012.pptx: Presentation of scans performed on Assembly 5
- VTT_Assembly5_3200e_100V_Tuned.cfg.root: Assembly 5 Configuration File: Threshold 3200e, 100V Detector Bias
- SourceScans_Assembly5_3200e.root: Assembly 5 source scan performed at threshold of 3200e
| I | Attachment | History | Action | Size | Date | Who | Comment |
|---|---|---|---|---|---|---|---|
 pptx |
Assembly5_02082012.pptx | r1 | manage | 3747.9 K | 2012-08-02 - 08:37 | RichardBates | PPT of scans on Assembly 5 |
 root |
SourceScans_Assembly5_3200e.root | r1 | manage | 1892.6 K | 2012-12-18 - 15:02 | KateDoonan | |
| root |
VTT_Assembly5_3200e_100V_Tuned.cfg.root | r1 | manage | 118.4 K | 2012-10-09 - 09:26 | RichardBates | Assembly5 Config file 3200electrons 100V Det Bias |
Topic revision: r3 - 2012-12-18 - KateDoonan
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