This wafer has been on the probe station for longe than usual due to the testing of a new probe card. The dirt is a worry. The wafer will eiterh be replaced by a wafer tested in the UK or cleaned at VTT and used if the timescales of testing are not suitable.

Some pictures of the wafer are shown:

-- RichardBates - 2012-02-22

Topic attachments
I Attachment History Action Size Date Who Comment
PDFpdf Pics-of_Dirty-Wafer-for-R-Bates-20-Feb-2012-cmp.pdf r1 manage 1966.6 K 2012-02-22 - 11:22 RichardBates Picture of the wafer
Topic revision: r1 - 2012-02-22 - RichardBates
 
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