Difference: WaferProbing (1 vs. 17)

Revision 172015-04-23 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Line: 87 to 87
 

FE-I4B Wafers at Edinburgh

Wafer Status
Changed:
<
<
VZBSDRH Untested
VZBSBSH Untested
V1BSDPH Untested
VGBSF8H Untested
>
>
VZBSDRH Shipped to RAL
VZBSBSH Shipped to RAL
V1BSDPH Shipped to RAL
VGBSF8H Shipped to RAL
 

FE-I4B Wafers at RAL

Wafer Status
V0BSDQH Tested and returned to Glasgow
Added:
>
>
VZBSDRH Tested and shipped to Glasgow
VZBSBSH Tested and shipped to Glasgow
V1BSDPH Tested and shipped to Glasgow
VGBSF8H Tested and shipped to Glasgow

Tested FE-I4B Wafers

Wafer Test Site Current Location
VUBSAFH Glasgow Glasgow
VZBSDRH RAL Glasgow
VZBSBSH RAL Glasgow
V1BSDPH RAL Glasgow
VGBSF8H RAL Glasgow
 

FE-I4B Probe Card

Revision 162014-09-10 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Line: 81 to 81
 
VEBSAVH Probe Commissioning
VQBSEHH  
VUBSAFH Probing Complete
Changed:
<
<
V0BSDQH Shipped to RAL
>
>
V0BSDQH Shipped to RAL - Returned to Glasgow (Sept 2014)
 

FE-I4B Wafers at Edinburgh

Line: 95 to 95
 

FE-I4B Wafers at RAL

Wafer Status
Changed:
<
<
V0BSDQH  
>
>
V0BSDQH Tested and returned to Glasgow
 

FE-I4B Probe Card

Revision 152014-05-14 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Line: 55 to 55
 

FE-I4A Wafers at Glasgow

Wafer Status
Changed:
<
<
V2AQMLH Probe Commissioning
>
>
V2AQMLH Probe Commissioning - Taken to Edinburgh 08/05/2014
VCAQMBH Untested - Taked to Edinburgh 08/05/2014
VZABA9H Untested - Taked to Edinbrugh 08/05/2014
V4AQMJH Untested - Taked to Edinburgh 08/05/2014
VXAQMRH Untested - Taked to Edinburgh 08/05/2014
 

FE-I4A Wafers at Edinburgh

Wafer Status
Line: 65 to 69
 
VFAQM8H  
V5AKMNH  
V1AQMMH  
Added:
>
>
V2AQMLH  
VCAQMBH  
VZABA9H  
V4AQMJH  
VXAQMRH  
 

FE-I4B Wafers at Glasgow

Wafer Status
VEBSAVH Probe Commissioning
VQBSEHH  
Changed:
<
<
VUBSAFH currently under test 15/04/2014
V0BSDQH Shipping to RAL
>
>
VUBSAFH Probing Complete
V0BSDQH Shipped to RAL

FE-I4B Wafers at Edinburgh

Wafer Status
VZBSDRH Untested
VZBSBSH Untested
V1BSDPH Untested
VGBSF8H Untested

FE-I4B Wafers at RAL

Wafer Status
V0BSDQH  
 

FE-I4B Probe Card

Revision 142014-04-17 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Line: 52 to 52
  * FE-I4_summary_backhaus.pdf: FE-I4A Summary
Changed:
<
<

FE-I4B Wafer Probing at Glasgow

>
>

FE-I4A Wafers at Glasgow

 
Wafer Status
Changed:
<
<
VEBSAVH Probe Commissioning
VQBSEHH  
VUBSAFH  
>
>
V2AQMLH Probe Commissioning

FE-I4A Wafers at Edinburgh

Wafer Status
V8AKMKH Probe Commissioning
VEAQM9H  
VMAKHRH  
VFAQM8H  
V5AKMNH  
V1AQMMH  

FE-I4B Wafers at Glasgow

Wafer Status
VEBSAVH Probe Commissioning
VQBSEHH  
VUBSAFH currently under test 15/04/2014
 
V0BSDQH Shipping to RAL

FE-I4B Probe Card

Revision 132014-01-31 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Line: 58 to 58
 
VEBSAVH Probe Commissioning
VQBSEHH  
VUBSAFH  
Changed:
<
<
V0BSDQH  
>
>
V0BSDQH Shipping to RAL
 

FE-I4B Probe Card

Revision 122013-11-27 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Changed:
<
<
The following modifications should be made to the Probe Card
>
>
The following modifications should be made to the Probe Card (FE-I4A only)
 
  • Add solder jumper to right side of T1
  • Add solder jumper to VTH_INT1
  • Add solder jumper to VBB_INT1
Line: 60 to 60
 
VUBSAFH  
V0BSDQH  
Added:
>
>

FE-I4B Probe Card

 

FE-I4B Wafer Probing Reports from University of Bonn

Revision 112013-11-20 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Line: 55 to 55
 

FE-I4B Wafer Probing at Glasgow

Wafer Status
Added:
>
>
VEBSAVH Probe Commissioning
VQBSEHH  
VUBSAFH  
V0BSDQH  
 

FE-I4B Wafer Probing Reports from University of Bonn

Revision 102013-11-19 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Line: 52 to 52
  * FE-I4_summary_backhaus.pdf: FE-I4A Summary
Added:
>
>

FE-I4B Wafer Probing at Glasgow

Wafer Status
 

FE-I4B Wafer Probing Reports from University of Bonn

* WaferProbingSetupFEI4b.pdf: FE-I4B Wafer Probing Setup

Revision 92013-07-04 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Revision 82013-04-04 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Line: 23 to 23
 
1 University of Glasgow
2 University of Edinburgh
3 RAL
Added:
>
>
4 University of Glasgow
 

Fourth probe card ordered 21 Jan 2013

Revision 72013-01-22 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Line: 24 to 24
 
2 University of Edinburgh
3 RAL
Added:
>
>

Fourth probe card ordered 21 Jan 2013

 

Procedure for adding a Probe Station to STControl

  • Control of Probe Stations in STControl is handled in the PixLib package.
  • The PixLib package is usually located in 'C:\USBpixI4\host\trunk\Applications\Pixel'

Revision 62012-10-05 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Line: 39 to 39
 
  • See instructions for compiling on Updating USBPix
  • Your probe station should now appear in the list of probe stations in the wafer panel in STControl
Added:
>
>

Wafer statistics are here

 

Reports

* Wafer_Probing_info_for_Bonn.pdf: Die Probing Setup at Glasgow

Revision 52012-09-28 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Line: 36 to 36
 
  • Add the new probe station class files to the main PixLib Make files (Makefile and Makefile_windows)
  • Add additional headers and/or libraries needed for control of your prober (e.g ni4882.h, visa.h, visatype.h, visa32.lib) to the inc and lib folders in C:\USBpixI4\host\trunk
  • Do a full compilation of the code from C:\USBpixI4\host\trunk
Added:
>
>
 
  • Your probe station should now appear in the list of probe stations in the wafer panel in STControl

Reports

Revision 42012-09-28 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Line: 24 to 24
 
2 University of Edinburgh
3 RAL
Added:
>
>

Procedure for adding a Probe Station to STControl

  • Control of Probe Stations in STControl is handled in the PixLib package.
  • The PixLib package is usually located in 'C:\USBpixI4\host\trunk\Applications\Pixel'
  • Control of the new probe station should be written as a class (.cxx/.h) inheriting from the abstract class PixProber.cxx/.h
  • The new probe station class (NewPixProber.cxx/.h) should be saved in the Applications\Pixel\PixLib\PixProber folder .
  • Add the following lines to the PixProber.cxx file
    • Add header file for the new probe station, e.g. #include "PixProber/NewPixProber.h"
    • Add code for NewPixProber to PixProber::make and PixProber::listTypes constructors
  • Add the new probe station class files to the PixProber Make files (Makefile and Makefile_windows)
  • Add the new probe station class files to the main PixLib Make files (Makefile and Makefile_windows)
  • Add additional headers and/or libraries needed for control of your prober (e.g ni4882.h, visa.h, visatype.h, visa32.lib) to the inc and lib folders in C:\USBpixI4\host\trunk
  • Do a full compilation of the code from C:\USBpixI4\host\trunk
  • Your probe station should now appear in the list of probe stations in the wafer panel in STControl
 

Reports

* Wafer_Probing_info_for_Bonn.pdf: Die Probing Setup at Glasgow

Revision 32012-07-13 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Added:
>
>
The following modifications should be made to the Probe Card
  • Add solder jumper to right side of T1
  • Add solder jumper to VTH_INT1
  • Add solder jumper to VBB_INT1
  • Remove R11
  • Remove C31
  • Add jumper to right contacts of tristate jumper CMD_CHIPID0
  • Add jumper to right contacts of tristate jumper CMD_CHIPID1
  • Tristate jumper T3_PAD should be connected to Vdda1
 
  • Jumper needs to be added to 3_3VEFUSE pins to power LEDs.
  • Right LED turns on at first contact between needle and bond pad.
  • Left LED turns on after approximately 20um of overdrive.
Line: 11 to 22
 
Probe Card Location
1 University of Glasgow
2 University of Edinburgh
Added:
>
>
3 RAL
 

Reports

Revision 22012-05-30 - AndrewStewart

Line: 1 to 1
 
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

Line: 15 to 15
 

Reports

* Wafer_Probing_info_for_Bonn.pdf: Die Probing Setup at Glasgow

Changed:
<
<

FE-I4 Probing Reports from University of Bonn

>
>

FE-I4A Wafer Probing Reports

* FE-I4_summary_backhaus.pdf: FE-I4A Summary

FE-I4B Wafer Probing Reports from University of Bonn

  * WaferProbingSetupFEI4b.pdf: FE-I4B Wafer Probing Setup
Line: 26 to 31
 
META FILEATTACHMENT attachment="Wafer_Probing_info_for_Bonn.pdf" attr="" comment="Die Probing Setup" date="1337263443" name="Wafer_Probing_info_for_Bonn.pdf" path="C:\Documents and Settings\astewart\My Documents\Presentations\Die Probing\Wafer Probing info for Bonn.pdf" size="405945" stream="C:\Documents and Settings\astewart\My Documents\Presentations\Die Probing\Wafer Probing info for Bonn.pdf" tmpFilename="/usr/tmp/CGItemp42678" user="AndrewStewart" version="1"
META FILEATTACHMENT attachment="WaferProbingSetupFEI4b.pdf" attr="" comment="FE-I4B Wafer Probing Setup" date="1337264783" name="WaferProbingSetupFEI4b.pdf" path="C:\Documents and Settings\astewart\My Documents\Reports\FE_I4 Wafer Probing\WaferProbingSetupFEI4b.pdf" size="760790" stream="C:\Documents and Settings\astewart\My Documents\Reports\FE_I4 Wafer Probing\WaferProbingSetupFEI4b.pdf" tmpFilename="/usr/tmp/CGItemp42889" user="AndrewStewart" version="1"
META FILEATTACHMENT attachment="WaferProbingTalkFEI4B_DavidPohl-2.pdf" attr="" comment="FE-I4B Wafer Probing" date="1337264835" name="WaferProbingTalkFEI4B_DavidPohl-2.pdf" path="C:\Documents and Settings\astewart\My Documents\Reports\FE_I4 Wafer Probing\WaferProbingTalkFEI4B_DavidPohl-2.pdf" size="2015232" stream="C:\Documents and Settings\astewart\My Documents\Reports\FE_I4 Wafer Probing\WaferProbingTalkFEI4B_DavidPohl-2.pdf" tmpFilename="/usr/tmp/CGItemp42893" user="AndrewStewart" version="1"
Added:
>
>
META FILEATTACHMENT attachment="FE-I4_summary_backhaus.pdf" attr="" comment="FE-I4A Summary" date="1338388157" name="FE-I4_summary_backhaus.pdf" path="FE-I4_summary_backhaus.pdf" size="13869574" stream="FE-I4_summary_backhaus.pdf" tmpFilename="/usr/tmp/CGItemp26484" user="AndrewStewart" version="1"

Revision 12012-05-17 - AndrewStewart

Line: 1 to 1
Added:
>
>
META TOPICPARENT name="Modules"

Wafer Probing Info

Notes

  • Jumper needs to be added to 3_3VEFUSE pins to power LEDs.
  • Right LED turns on at first contact between needle and bond pad.
  • Left LED turns on after approximately 20um of overdrive.
  • Right LED remains ON after needles retracted (?). Needle bent or not returning to original position (?).

PTSL Probe Cards

Probe Card Location
1 University of Glasgow
2 University of Edinburgh

Reports

* Wafer_Probing_info_for_Bonn.pdf: Die Probing Setup at Glasgow

FE-I4 Probing Reports from University of Bonn

* WaferProbingSetupFEI4b.pdf: FE-I4B Wafer Probing Setup

* WaferProbingTalkFEI4B_DavidPohl-2.pdf: FE-I4B Wafer Probing

-- AndrewStewart - 2012-05-17

META FILEATTACHMENT attachment="Wafer_Probing_info_for_Bonn.pdf" attr="" comment="Die Probing Setup" date="1337263443" name="Wafer_Probing_info_for_Bonn.pdf" path="C:\Documents and Settings\astewart\My Documents\Presentations\Die Probing\Wafer Probing info for Bonn.pdf" size="405945" stream="C:\Documents and Settings\astewart\My Documents\Presentations\Die Probing\Wafer Probing info for Bonn.pdf" tmpFilename="/usr/tmp/CGItemp42678" user="AndrewStewart" version="1"
META FILEATTACHMENT attachment="WaferProbingSetupFEI4b.pdf" attr="" comment="FE-I4B Wafer Probing Setup" date="1337264783" name="WaferProbingSetupFEI4b.pdf" path="C:\Documents and Settings\astewart\My Documents\Reports\FE_I4 Wafer Probing\WaferProbingSetupFEI4b.pdf" size="760790" stream="C:\Documents and Settings\astewart\My Documents\Reports\FE_I4 Wafer Probing\WaferProbingSetupFEI4b.pdf" tmpFilename="/usr/tmp/CGItemp42889" user="AndrewStewart" version="1"
META FILEATTACHMENT attachment="WaferProbingTalkFEI4B_DavidPohl-2.pdf" attr="" comment="FE-I4B Wafer Probing" date="1337264835" name="WaferProbingTalkFEI4B_DavidPohl-2.pdf" path="C:\Documents and Settings\astewart\My Documents\Reports\FE_I4 Wafer Probing\WaferProbingTalkFEI4B_DavidPohl-2.pdf" size="2015232" stream="C:\Documents and Settings\astewart\My Documents\Reports\FE_I4 Wafer Probing\WaferProbingTalkFEI4B_DavidPohl-2.pdf" tmpFilename="/usr/tmp/CGItemp42893" user="AndrewStewart" version="1"
 
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