Inter-strip capacitance measurments
Measurements performed by Alex Chilingarov, University of Lancaster and analysis is done by Lars Eklund, University of Glasgow.
Summary plots for w14 (6 um BCB)
Total current vs. voltage for all measured sensors on wafer 14
Capacitance between one central strip to its two neighbours vs. bias voltage for 100 kHz and 1 MHz
All measurements done with 1 Mohm resistor and an ampere meter connected between the bias rail and
the HV return (ground) except for the measurement
X5Y1/2 where bias rail was connected directly to the ground
Time evolution of the capacitance of one strip to its two neighbours at 600 V
All measurements done with 1 Mohm resistor and an ampere meter connected between the bias rail and
the HV return (ground) except for the measurement
X5Y1/2 where bias rail was connected directly to the ground
Evolution of reverse curret at 600 V
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LarsEklund - 16 Dec 2008