DESY March 2012 PPS Testbeam

This page documents the results of March 2012 PPS testbeam at DESY. The result can also be found in this presentation.

Devices

Devices used

NB numbers in brackets refer to device I.D. number used by reconstruction and analysis code.

Device specifications

NB numbers in brackets refer dimension including non-active (insensitive) area.

Event runs

A spreadsheet on Event runs can be found here.

4A runs DUT0: SCC-31(20), DUT1: Micron1(21)

Tilted geometry (at -100V bias):

NB The spreadsheet for these tilted orientations and the tilted 4B runs below is incorrect (wrong, wrong, wrong!). The best check of orientation is the relative (i.e. compared with parallel orientation) clusterSize value, which should increase for any tilt. The orthogonal direction of the tilt can then be inferred from the relative clusterSizeX and clusterSizeY values.

4B runs DUT1: Micron2, DUT0: Micron3

Tilted geometry (at -100V bias & THL=3200e):

NB See 4A note above.

Reconstruction

Here are links to example gear file and config file (from 3710-3749 runs). Link to reconstruction files on Grid... todo.

DUT positions

There were various positions quoted for DUTs from twiki, run spreadsheet and email. The table below provides the "best guess" positions used. Positions, relative to the back of the 3rd (mimosa2) reference sensor are given, as well as orientations for each bias.

Analysis

Here are links to example driver file and makefile (from 3710-3749 runs). At some point link to [[][eos files]]...todo

Analysis Cuts

chi2 and lv1 cuts are based on maxcellres_DUT_chi2 and maxcellres_DUT_lv1 distributions (where DUT is suitably substituted), respectively.

Results

Please see the talk linked to at the top of the page.

...or...

The plots from resulting analyses can be found by selecting the PPS_MARCH_2012 in the IBL Testbeam Plots drop-down menu in this page. The name of each plot appears when rolled-over by the pointer. The naming convention of the plots is as follows: name begins with "graph" for each bias/angle Vs X plot, or "overlay" for plots overlaid; then plot name (as named by the analysis routines); and then, a short tag summing up the plot comparison, i.e. "THL" for threshold comparison, "tilt" for angle comparison, "val" for validation plot, "Micron" for device comparison and "Temp" for temperature comparison. Also, by selecting PPS_qEff_X (where "X" is comparison class as explicated above) from the same drop-down menu, sub-pixel scans are also available.

-- KennyWraight - 2013-11-12