Difference: MCMDCis (1 vs. 2)
Revision 22008-12-17 - LarsEklund
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Inter-strip capacitance measurmentsMeasurements performed by Alex Chilingarov, University of Lancaster and analysis is done by Lars Eklund, University of Glasgow.Summary plots for w14 (6 um BCB) | |||||||||||||
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| > > | Total current vs. voltage for all measured sensors on wafer 14
Capacitance between one central strip to its two neighbours vs. bias voltage for 100 kHz and 1 MHz
Time evolution of the capacitance of one strip to its two neighbours at 600 V
Evolution of reverse curret at 600 V
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Revision 12008-12-16 - LarsEklund
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Inter-strip capacitance measurmentsMeasurements performed by Alex Chilingarov, University of Lancaster and analysis is done by Lars Eklund, University of Glasgow.Summary plots for w14 (6 um BCB)-- LarsEklund - 16 Dec 2008 | |||||||
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