Wafer and sensor numbering scheme

The wafers are marked with sensor number at the wafer edge close to the larger straight section of the border. The individual sensors are labelled by their X and Y positions on the wafer. The classification of the wafers and the definition of the wafer number can be found in SensorNumbering.pdf.

Electrical measurements of Run 1

I/V and C/V measurements of all sensors before dicing

Inter-strip capacitance measurements of all sensors before dicing

Documentation and photos

Photos at reception of the wafers

Bias bonds on measured wafers

Yield measurements

Mechanical measurements

Sensor flatness

-- LarsEklund - 21 Nov 2008