(r4) SingleDeviceCharacterization < ATLAS/PUUKA

ATLAS/PUUKA Web>Tasks>Modules>SingleDeviceCharacterization (revision 4) (raw view)~~EditAttach~~

---+ Characterisation of Single Devices in Glasgow University and the UK
---++ Assembly Details

Some notes on assembly, including wirebond program and design of Al plate, are given here for the single chip card

[[AssemblyDetails]]
---++ Characterisation Notes

Christian Gallrapp Guide to USBPix

[[%ATTACHURL%/2012-02-17_ChristianGallrapp_Introduction_to_USBPix.pdf][2012-02-17_ChristianGallrapp_Introduction_to_USBPix.pdf]]

Kate's Noise Occupancy Scan and Source Scan Instructions

[[%ATTACHURL%/Noise_Occupancy_Scan_Instructions.docx][Noise_Occupancy_Scan_Instructions.docx]]

[[%ATTACHURL%/Source_Scans_Instructions.docx][Source_Scans_Instructions.docx]]
---++ Basic Files Required For Characterising an Assembly

*CONFIGURATION FILES*

Basic *configuration file* for starting tuning of an assembly:

[[%ATTACHURL%/000_BASELINE_CONFIG_all_assemblies.cfg.root][000_BASELINE_CONFIG_all_assemblies.cfg.root]]

Basic *configuration file for VCal* measurement of an assembly:

(the primary address of your own Keithley must be correct for this to work)

[[%ATTACHURL%/000_BASELINE_VCAL_CONFIG_all_assemblies.cfg.root][000_BASELINE_VCAL_CONFIG_all_assemblies.cfg.root]]

*PRIMLISTS*

Primlists are lists of scans which can be saved and executed automatically without further manual input.

*Primlist* containing all *initial tests* required when testing an assembly:
   * RX Delay
   * Analog
   * Digital
   * Noise Occupancy
   * Threshold Scan
   * ToT Verify

[[%ATTACHURL%/000_BASELINE_TESTS_all_assemblies.prl.root][000_BASELINE_TESTS_all_assemblies.prl.root]]

*Primlist* for *tuning* assembly to Threshold of 3200e at ToT o f 8:

[[%ATTACHURL%/3200e_ToT8_overalltuning.prl.root][3200e_ToT8_overalltuning.prl.root]]
---++ 
---++ ROIC only

[[WaferV6ABC1HChip50]]

---++ Planar from VTT

15 single assemblies have been produced at VTT. These are detailed at [[Assemblies]].

Summaries and root data files for the assemblies tested are given under the assembly heading.

Assembly test data

[[Assembly5]]

[[Assembly10]]

[[Assembly14]]

[[Assembly15]]

---++ Planar

Micron Liverpool

[[%ATTACHURL%/MICRONCurves_2012.xlsx][MICRONCurves_2012.xlsx]]

MPI Sensor

[[%ATTACHURL%/MPI_IV.xlsx][MPI_IV.xlsx]]
---++ 3D

FBK 7

IV Characteristics of the FBK 7 assembly:

[[%ATTACHURL%/IV_Curve_FBK_200212.xlsx][IV_Curve_FBK_200212.xlsx]]

Details of noise characterisation of the FBK 7 assembly:

[[%ATTACHURL%/FBK_Noise.pptx][FBK_Noise.pptx]]

Further information on FBK 7:

[[GE_FBK4_3D_07]]

-- Main.RichardBates - 2012-02-22

Attachments

Topic attachments
I	Attachment	History	Action	Size	Date	Who	Comment
root	000_BASELINE_CONFIG_all_assemblies.cfg.root	r1	manage	119.7 K	2012-12-17 - 15:30	KateDoonan
root	000_BASELINE_TESTS_all_assemblies.prl.root	r1	manage	132.8 K	2012-12-17 - 15:35	KateDoonan
root	000_BASELINE_VCAL_CONFIG_all_assemblies.cfg.root	r1	manage	118.1 K	2012-12-17 - 15:34	KateDoonan
pdf	2012-02-17_ChristianGallrapp_Introduction_to_USBPix.pdf	r1	manage	183.2 K	2012-12-17 - 15:15	KateDoonan	Christian Gallrapp Guide
root	3200e_ToT8_overalltuning.prl.root	r1	manage	1483.8 K	2012-12-17 - 15:39	KateDoonan
pptx	FBK_Noise.pptx	r1	manage	323.1 K	2012-12-17 - 15:28	KateDoonan
xlsx	IV_Curve_FBK_200212.xlsx	r1	manage	13.3 K	2012-12-17 - 15:20	KateDoonan
xlsx	MICRONCurves_2012.xlsx	r1	manage	26.3 K	2012-12-17 - 15:19	KateDoonan
xlsx	MPI_IV.xlsx	r1	manage	12.1 K	2012-12-17 - 15:19	KateDoonan
docx	Noise_Occupancy_Scan_Instructions.docx	r1	manage	19.8 K	2012-12-17 - 15:17	KateDoonan
docx	Source_Scans_Instructions.docx	r1	manage	21.7 K	2012-12-17 - 15:17	KateDoonan

Topic revision: r4 - 2012-12-17 - KateDoonan

ATLAS/PUUKA