This wafer has been on the probe station for longe than usual due to the testing of a new probe card. The dirt is a worry. The wafer will eiterh be replaced by a wafer tested in the UK or cleaned at VTT and used if the timescales of testing are not suitable. Some pictures of the wafer are shown: * [[%ATTACHURL%/Pics-of_Dirty-Wafer-for-R-Bates-20-Feb-2012-cmp.pdf][Pics-of_Dirty-Wafer-for-R-Bates-20-Feb-2012-cmp.pdf]]: Pictures of the wafer -- Main.RichardBates - 2012-02-22
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Pics-of_Dirty-Wafer-for-R-Bates-20-Feb-2012-cmp.pdf
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2012-02-22 - 11:22
RichardBates
Picture of the wafer
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Topic revision: r1 - 2012-02-22 - RichardBates
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