Inter-strip capacitance measurments

Measurements performed by Alex Chilingarov, University of Lancaster and analysis is done by Lars Eklund, University of Glasgow.

Summary plots for w14 (6 um BCB)

Total current vs. voltage for all measured sensors on wafer 14

Capacitance between one central strip to its two neighbours vs. bias voltage for 100 kHz and 1 MHz

Time evolution of the capacitance of one strip to its two neighbours at 600 V

Evolution of reverse curret at 600 V

-- LarsEklund - 16 Dec 2008