This wafer has been on the probe station for longe than usual due to the testing of a new probe card. The dirt is a worry. The wafer will eiterh be replaced by a wafer tested in the UK or cleaned at VTT and used if the timescales of testing are not suitable.
Some pictures of the wafer are shown:
- Pics-of_Dirty-Wafer-for-R-Bates-20-Feb-2012-cmp.pdf: Pictures of the wafer
| I | Attachment | History | Action | Size | Date | Who |
Comment |
|---|---|---|---|---|---|---|---|
 pdf |
Pics-of_Dirty-Wafer-for-R-Bates-20-Feb-2012-cmp.pdf | r1 | manage | 1966.6 K | 2012-02-22 - 11:22 | RichardBates | Picture of the wafer |
This topic: ATLAS/PUUKA > WebHome > Tasks > Modules > Our_FEI4_wafers > V5ABC2H > PicturesOfTheWaferFromVTT
Topic revision: r1 - 2012-02-22 - RichardBates
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